Move to ASF4 and introduce SAMD51 support. (#258)3.0.0-alpha.0

* atmel-samd: Remove ASF3. This will break builds.

* atmel-samd: Add ASF4 for the SAMD21 and SAMD51.

* Introduce the supervisor concept to facilitate porting.

The supervisor is the code which runs individual MicroPython VMs. By
splitting it out we make it more consistent and easier to find.

This also adds very basic SAMD21 and SAMD51 support using the
supervisor. Only the REPL currently works.

This begins the work for #178.

1 files changed, 143 insertions, 149 deletions

diff --git a/atmel-samd/common-hal/microcontroller/Processor.c b/atmel-samd/common-hal/microcontroller/Processor.c
index c398c5e6f..a037c42db 100644
--- a/atmel-samd/common-hal/microcontroller/Processor.c
+++ b/atmel-samd/common-hal/microcontroller/Processor.c
@@ -63,175 +63,169 @@
 
 #include "common-hal/microcontroller/Processor.h"
 
-// Don't reorder these includes because they are dependencies of adc_feature.h.
-// They should really be included by adc_feature.h.
-#include <compiler.h>
-#include "asf/sam0/drivers/system/clock/gclk.h"
-#include "asf/sam0/utils/cmsis/samd21/include/component/adc.h"
 
-#include "asf/sam0/drivers/adc/adc_sam_d_r/adc_feature.h"
-#include "asf/sam0/drivers/adc/adc.h"
-
-#define ADC_TEMP_SAMPLE_LENGTH    4
-#define INT1V_VALUE_FLOAT         1.0
-#define INT1V_DIVIDER_1000	  1000.0
-#define ADC_12BIT_FULL_SCALE_VALUE_FLOAT        4095.0
-
-typedef struct nvm_calibration_data_t {
-    float tempR;       // Production Room temperature
-    float tempH;       // Production Hot temperature
-    float INT1VR;      // Room temp 2's complement of the internal 1V reference value
-    float INT1VH;      // Hot temp 2's complement of the internal 1V reference value
-    uint16_t ADCR;     // Production Room temperature ADC value
-    uint16_t ADCH;     // Production Hot temperature ADC value
-    float VADCR;       // Room temperature ADC voltage
-    float VADCH;       // Hot temperature ADC voltage
-} nvm_calibration_data_t;
+// #define ADC_TEMP_SAMPLE_LENGTH    4
+// #define INT1V_VALUE_FLOAT         1.0
+// #define INT1V_DIVIDER_1000	  1000.0
+// #define ADC_12BIT_FULL_SCALE_VALUE_FLOAT        4095.0
+//
+// typedef struct nvm_calibration_data_t {
+//     float tempR;       // Production Room temperature
+//     float tempH;       // Production Hot temperature
+//     float INT1VR;      // Room temp 2's complement of the internal 1V reference value
+//     float INT1VH;      // Hot temp 2's complement of the internal 1V reference value
+//     uint16_t ADCR;     // Production Room temperature ADC value
+//     uint16_t ADCH;     // Production Hot temperature ADC value
+//     float VADCR;       // Room temperature ADC voltage
+//     float VADCH;       // Hot temperature ADC voltage
+// } nvm_calibration_data_t;
 
 
 // Decimal to fraction conversion. (adapted from ASF sample).
-STATIC float convert_dec_to_frac(uint8_t val) {
-    float float_val = (float)val;
-    if (val < 10) {
-        return (float_val/10.0);
-    } else if (val < 100) {
-        return (float_val/100.0);
-    } else {
-        return (float_val/1000.0);
-    }
-}
-
-STATIC void configure_adc_temp(struct adc_module *adc_instance) {
-    struct adc_config config_adc;
-    adc_get_config_defaults(&config_adc);
-
-    // The parameters chosen here are from the temperature example in:
-    // http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
-    // That note also recommends in general:
-    // "Discard the first conversion result whenever there is a change
-    // in ADC configuration like voltage reference / ADC channel change."
-
-    config_adc.clock_prescaler = ADC_CLOCK_PRESCALER_DIV16;
-    config_adc.reference = ADC_REFERENCE_INT1V;
-    config_adc.positive_input = ADC_POSITIVE_INPUT_TEMP;
-    config_adc.negative_input = ADC_NEGATIVE_INPUT_GND;
-    config_adc.sample_length = ADC_TEMP_SAMPLE_LENGTH;
-
-    adc_init(adc_instance, ADC, &config_adc);
-
-    // Oversample and decimate. A higher samplenum produces a more stable result.
-    ADC->AVGCTRL.reg = ADC_AVGCTRL_ADJRES(2) | ADC_AVGCTRL_SAMPLENUM_4;
-    //ADC->AVGCTRL.reg = ADC_AVGCTRL_ADJRES(4) | ADC_AVGCTRL_SAMPLENUM_16;
-}
+// STATIC float convert_dec_to_frac(uint8_t val) {
+//     float float_val = (float)val;
+//     if (val < 10) {
+//         return (float_val/10.0);
+//     } else if (val < 100) {
+//         return (float_val/100.0);
+//     } else {
+//         return (float_val/1000.0);
+//     }
+// }
+
+// STATIC void configure_adc_temp(struct adc_module *adc_instance) {
+//     struct adc_config config_adc;
+//     adc_get_config_defaults(&config_adc);
+//
+//     // The parameters chosen here are from the temperature example in:
+//     // http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
+//     // That note also recommends in general:
+//     // "Discard the first conversion result whenever there is a change
+//     // in ADC configuration like voltage reference / ADC channel change."
+//
+//     config_adc.clock_prescaler = ADC_CLOCK_PRESCALER_DIV16;
+//     config_adc.reference = ADC_REFERENCE_INT1V;
+//     config_adc.positive_input = ADC_POSITIVE_INPUT_TEMP;
+//     config_adc.negative_input = ADC_NEGATIVE_INPUT_GND;
+//     config_adc.sample_length = ADC_TEMP_SAMPLE_LENGTH;
+//
+//     adc_init(adc_instance, ADC, &config_adc);
+//
+//     // Oversample and decimate. A higher samplenum produces a more stable result.
+//     ADC->AVGCTRL.reg = ADC_AVGCTRL_ADJRES(2) | ADC_AVGCTRL_SAMPLENUM_4;
+//     //ADC->AVGCTRL.reg = ADC_AVGCTRL_ADJRES(4) | ADC_AVGCTRL_SAMPLENUM_16;
+// }
 
 // Extract the production calibration data information from NVM (adapted from ASF sample).
 //
-STATIC void load_calibration_data(nvm_calibration_data_t *cal) {
-    volatile uint32_t val1;    /* Temperature Log Row Content first 32 bits */
-    volatile uint32_t val2;    /* Temperature Log Row Content another 32 bits */
-    uint8_t room_temp_val_int; /* Integer part of room temperature in °C */
-    uint8_t room_temp_val_dec; /* Decimal part of room temperature in °C */
-    uint8_t hot_temp_val_int;  /* Integer part of hot temperature in °C */
-    uint8_t hot_temp_val_dec;  /* Decimal part of hot temperature in °C */
-    int8_t room_int1v_val;     /* internal 1V reference drift at room temperature */
-    int8_t hot_int1v_val;      /* internal 1V reference drift at hot temperature*/
-    
-    uint32_t *temp_log_row_ptr = (uint32_t *)NVMCTRL_TEMP_LOG;
-    
-    val1 = *temp_log_row_ptr;
-    temp_log_row_ptr++;
-    val2 = *temp_log_row_ptr;
-        
-    room_temp_val_int = (uint8_t)((val1 & NVMCTRL_FUSES_ROOM_TEMP_VAL_INT_Msk) >> NVMCTRL_FUSES_ROOM_TEMP_VAL_INT_Pos);
-    room_temp_val_dec = (uint8_t)((val1 & NVMCTRL_FUSES_ROOM_TEMP_VAL_DEC_Msk) >> NVMCTRL_FUSES_ROOM_TEMP_VAL_DEC_Pos);
-        
-    hot_temp_val_int = (uint8_t)((val1 & NVMCTRL_FUSES_HOT_TEMP_VAL_INT_Msk) >> NVMCTRL_FUSES_HOT_TEMP_VAL_INT_Pos);
-    hot_temp_val_dec = (uint8_t)((val1 & NVMCTRL_FUSES_HOT_TEMP_VAL_DEC_Msk) >> NVMCTRL_FUSES_HOT_TEMP_VAL_DEC_Pos);
-        
-    room_int1v_val = (int8_t)((val1 & NVMCTRL_FUSES_ROOM_INT1V_VAL_Msk) >> NVMCTRL_FUSES_ROOM_INT1V_VAL_Pos);
-    hot_int1v_val = (int8_t)((val2 & NVMCTRL_FUSES_HOT_INT1V_VAL_Msk) >> NVMCTRL_FUSES_HOT_INT1V_VAL_Pos);
-    
-    cal->ADCR = (uint16_t)((val2 & NVMCTRL_FUSES_ROOM_ADC_VAL_Msk) >> NVMCTRL_FUSES_ROOM_ADC_VAL_Pos);
-        
-    cal->ADCH = (uint16_t)((val2 & NVMCTRL_FUSES_HOT_ADC_VAL_Msk) >> NVMCTRL_FUSES_HOT_ADC_VAL_Pos);
-        
-    cal->tempR = room_temp_val_int + convert_dec_to_frac(room_temp_val_dec);
-    cal->tempH = hot_temp_val_int + convert_dec_to_frac(hot_temp_val_dec);
-        
-    cal->INT1VR = 1 - ((float)room_int1v_val/INT1V_DIVIDER_1000);
-    cal->INT1VH = 1 - ((float)hot_int1v_val/INT1V_DIVIDER_1000);
-        
-    cal->VADCR = ((float)cal->ADCR * cal->INT1VR)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
-    cal->VADCH = ((float)cal->ADCH * cal->INT1VH)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
-}
+// STATIC void load_calibration_data(nvm_calibration_data_t *cal) {
+//     volatile uint32_t val1;    /* Temperature Log Row Content first 32 bits */
+//     volatile uint32_t val2;    /* Temperature Log Row Content another 32 bits */
+//     uint8_t room_temp_val_int; /* Integer part of room temperature in °C */
+//     uint8_t room_temp_val_dec; /* Decimal part of room temperature in °C */
+//     uint8_t hot_temp_val_int;  /* Integer part of hot temperature in °C */
+//     uint8_t hot_temp_val_dec;  /* Decimal part of hot temperature in °C */
+//     int8_t room_int1v_val;     /* internal 1V reference drift at room temperature */
+//     int8_t hot_int1v_val;      /* internal 1V reference drift at hot temperature*/
+//
+//     uint32_t *temp_log_row_ptr = (uint32_t *)NVMCTRL_TEMP_LOG;
+//
+//     val1 = *temp_log_row_ptr;
+//     temp_log_row_ptr++;
+//     val2 = *temp_log_row_ptr;
+//
+//     room_temp_val_int = (uint8_t)((val1 & NVMCTRL_FUSES_ROOM_TEMP_VAL_INT_Msk) >> NVMCTRL_FUSES_ROOM_TEMP_VAL_INT_Pos);
+//     room_temp_val_dec = (uint8_t)((val1 & NVMCTRL_FUSES_ROOM_TEMP_VAL_DEC_Msk) >> NVMCTRL_FUSES_ROOM_TEMP_VAL_DEC_Pos);
+//
+//     hot_temp_val_int = (uint8_t)((val1 & NVMCTRL_FUSES_HOT_TEMP_VAL_INT_Msk) >> NVMCTRL_FUSES_HOT_TEMP_VAL_INT_Pos);
+//     hot_temp_val_dec = (uint8_t)((val1 & NVMCTRL_FUSES_HOT_TEMP_VAL_DEC_Msk) >> NVMCTRL_FUSES_HOT_TEMP_VAL_DEC_Pos);
+//
+//     room_int1v_val = (int8_t)((val1 & NVMCTRL_FUSES_ROOM_INT1V_VAL_Msk) >> NVMCTRL_FUSES_ROOM_INT1V_VAL_Pos);
+//     hot_int1v_val = (int8_t)((val2 & NVMCTRL_FUSES_HOT_INT1V_VAL_Msk) >> NVMCTRL_FUSES_HOT_INT1V_VAL_Pos);
+//
+//     cal->ADCR = (uint16_t)((val2 & NVMCTRL_FUSES_ROOM_ADC_VAL_Msk) >> NVMCTRL_FUSES_ROOM_ADC_VAL_Pos);
+//
+//     cal->ADCH = (uint16_t)((val2 & NVMCTRL_FUSES_HOT_ADC_VAL_Msk) >> NVMCTRL_FUSES_HOT_ADC_VAL_Pos);
+//
+//     cal->tempR = room_temp_val_int + convert_dec_to_frac(room_temp_val_dec);
+//     cal->tempH = hot_temp_val_int + convert_dec_to_frac(hot_temp_val_dec);
+//
+//     cal->INT1VR = 1 - ((float)room_int1v_val/INT1V_DIVIDER_1000);
+//     cal->INT1VH = 1 - ((float)hot_int1v_val/INT1V_DIVIDER_1000);
+//
+//     cal->VADCR = ((float)cal->ADCR * cal->INT1VR)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
+//     cal->VADCH = ((float)cal->ADCH * cal->INT1VH)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
+// }
 
 /*
  * Calculate fine temperature using Equation1 and Equation
  * 1b as mentioned in data sheet section "Temperature Sensor Characteristics"
  * of Electrical Characteristics. (adapted from ASF sample code).
  */
-STATIC float calculate_temperature(uint16_t raw_code, nvm_calibration_data_t *cal)
-{
-    float VADC;      /* Voltage calculation using ADC result for Coarse Temp calculation */
-    float VADCM;     /* Voltage calculation using ADC result for Fine Temp calculation. */
-    float INT1VM;    /* Voltage calculation for reality INT1V value during the ADC conversion */
-	
-    VADC = ((float)raw_code * INT1V_VALUE_FLOAT)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
-	
-    // Hopefully compiler will remove common subepxressions here.
-    
-    /* Coarse Temp Calculation by assume INT1V=1V for this ADC conversion */
-    float coarse_temp = cal->tempR + (((cal->tempH - cal->tempR)/(cal->VADCH - cal->VADCR)) * (VADC - cal->VADCR));
-	
-    /* Calculation to find the real INT1V value during the ADC conversion */
-    INT1VM = cal->INT1VR + (((cal->INT1VH - cal->INT1VR) * (coarse_temp - cal->tempR))/(cal->tempH - cal->tempR));
-	
-    VADCM = ((float)raw_code * INT1VM)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
-	
-    /* Fine Temp Calculation by replace INT1V=1V by INT1V = INT1Vm for ADC conversion */
-    float fine_temp = cal->tempR + (((cal->tempH - cal->tempR)/(cal->VADCH - cal->VADCR)) * (VADCM - cal->VADCR));
-	
-    return fine_temp;
-}
+// STATIC float calculate_temperature(uint16_t raw_code, nvm_calibration_data_t *cal)
+// {
+//     float VADC;      /* Voltage calculation using ADC result for Coarse Temp calculation */
+//     float VADCM;     /* Voltage calculation using ADC result for Fine Temp calculation. */
+//     float INT1VM;    /* Voltage calculation for reality INT1V value during the ADC conversion */
+//
+//     VADC = ((float)raw_code * INT1V_VALUE_FLOAT)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
+//
+//     // Hopefully compiler will remove common subepxressions here.
+//
+//     /* Coarse Temp Calculation by assume INT1V=1V for this ADC conversion */
+//     float coarse_temp = cal->tempR + (((cal->tempH - cal->tempR)/(cal->VADCH - cal->VADCR)) * (VADC - cal->VADCR));
+//
+//     /* Calculation to find the real INT1V value during the ADC conversion */
+//     INT1VM = cal->INT1VR + (((cal->INT1VH - cal->INT1VR) * (coarse_temp - cal->tempR))/(cal->tempH - cal->tempR));
+//
+//     VADCM = ((float)raw_code * INT1VM)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
+//
+//     /* Fine Temp Calculation by replace INT1V=1V by INT1V = INT1Vm for ADC conversion */
+//     float fine_temp = cal->tempR + (((cal->tempH - cal->tempR)/(cal->VADCH - cal->VADCR)) * (VADCM - cal->VADCR));
+//
+//     return fine_temp;
+// }
 
 
 // External interface.
 //
 float common_hal_mcu_processor_get_temperature(void) {
-    struct adc_module adc_instance_struct;
-
-    system_voltage_reference_enable(SYSTEM_VOLTAGE_REFERENCE_TEMPSENSE);
-    configure_adc_temp(&adc_instance_struct);
-    nvm_calibration_data_t nvm_calibration_data;
-    load_calibration_data(&nvm_calibration_data);
-    
-    adc_enable(&adc_instance_struct);
-
-    uint16_t data;
-    enum status_code status;
-
-    // Read twice and discard first result, as recommended in section 14 of
-    // http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
-    // "Discard the first conversion result whenever there is a change in ADC configuration
-    // like voltage reference / ADC channel change"
-    // Empirical observation shows the first reading is quite different than subsequent ones.
-
-    adc_start_conversion(&adc_instance_struct);
-    do {
-        status = adc_read(&adc_instance_struct, &data);
-    } while (status == STATUS_BUSY);
-
-    adc_start_conversion(&adc_instance_struct);
-    do {
-        status = adc_read(&adc_instance_struct, &data);
-    } while (status == STATUS_BUSY);
-
-    // Disable so that someone else can use the adc with different settings.
-    adc_disable(&adc_instance_struct);
-    return calculate_temperature(data, &nvm_calibration_data);
+    // struct adc_module adc_instance_struct;
+    //
+    // system_voltage_reference_enable(SYSTEM_VOLTAGE_REFERENCE_TEMPSENSE);
+    // configure_adc_temp(&adc_instance_struct);
+    // nvm_calibration_data_t nvm_calibration_data;
+    // load_calibration_data(&nvm_calibration_data);
+    //
+    // adc_enable(&adc_instance_struct);
+    //
+    // uint16_t data;
+    // enum status_code status;
+    //
+    // // Read twice and discard first result, as recommended in section 14 of
+    // // http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
+    // // "Discard the first conversion result whenever there is a change in ADC configuration
+    // // like voltage reference / ADC channel change"
+    // // Empirical observation shows the first reading is quite different than subsequent ones.
+    //
+    // adc_start_conversion(&adc_instance_struct);
+    // do {
+    //     status = adc_read(&adc_instance_struct, &data);
+    // } while (status == STATUS_BUSY);
+    //
+    // adc_start_conversion(&adc_instance_struct);
+    // do {
+    //     status = adc_read(&adc_instance_struct, &data);
+    // } while (status == STATUS_BUSY);
+    //
+    // // Disable so that someone else can use the adc with different settings.
+    // adc_disable(&adc_instance_struct);
+    // return calculate_temperature(data, &nvm_calibration_data);
+    return 0;
 }
 
 
 uint32_t common_hal_mcu_processor_get_frequency(void) {
-    return system_cpu_clock_get_hz();
+    return 0;
+    //return system_cpu_clock_get_hz();
 }